News and technical information about test & measurement

News and technical information about test & measurement equipment and strategies from the point of view of the R&D or design and development engineer. Topics include T&M hardware such as oscilloscopes and signal generators/analyzers, as well as software and test methodologies.
  • Celebrating engineering: EDN names 2010 Innovation Award winners

    EDN Staff, May 3, 2011


    EDN bestows its 21st annual Innovation Awards, honoring a diverse group of electronics engineers and the ground-breaking products they have produced.  More
  • The 15W Fender Squier guitar amplifier

    Paul Rako, Technical Editor, April 21, 2011
    Replacing all of the potentiometers makes a scratchy old amp sound great again.  More
  • An introduction to acoustic thermometry

    Jim Williams and Omar Sanchez-Felipe, Linear Technology, April 21, 2011
    Use an ultrasonic transducer to measure air temperature in an olive jar.  More
  • Floats like a butterfly, stings like a bee

    Jan Gazda, Engineer, April 21, 2011
    A new chip works perfectly the first time it is powered up, but never again. Is the problem the design, or elsewhere?  More
  • Understanding the impact of digitizer noise on oscilloscope measurements

    Jit Lim, Tektronix, April 7, 2011
    Whether you are designing or buying a digitizing system, you need some means of determining real-life performance. How closely does the output of any ADC, waveform digitizer, or DSO follow an analog input signal? ENOB testing provides a means of establishing a figure of merit for dynamic digitizing performance.  More
  • Band together

    Kunal Ghosh, Project Manager, April 7, 2011
    One engineer given the task of testing graphics equalizers devises a way to speed up the process.  More
  • Acid test

    David R Bryce, Electronics Engineer, March 17, 2011
    Figuring out the reason behind an increase in warranty claims on a redesigned product gives one engineer a new appreciation for chemistry and a renewed dedication to multidisciplinary design reviews.  More
  • Cheaper to keep 'er

    Nicholas Gray, Engineer, March 3, 2011
    A vexing problem provides a valuable lesson about anticipating a product’s end use and the difference between automated testing and actual use.  More
  • NI plans 19% R&D headcount increase as sales reach new records

    By Suzanne Deffree, Managing editor, news, January 26, 2011
    Hiring plans that call for an overall 17% increase in headcount were stated in NI's report on Q4 2010, a quarter that showed record revenue of $250 million and that capped a year showing record revenue of $873 million.  More
  • Managing signal integrity in tomorrow's high-speed flash-memory-system designs

    Perry Keller, Agilent Technologies, January 20, 2011
    Next-generation flash-memory technology will tout data-transfer rates as much as 10 times faster than currently available. However, increasing distortions in the data-carrying digital signals can cause data-transfer failures, complicating the management of signal integrity. Proper design strategies can help you deliver reliable, high-performance products.  More  

  • Go ahead. Make my day!
    Todor Arsenov, Electronics Engineer, January 20, 2011


    Under the watchful eye of the manufacturing department, a design engineer struggles to establish the correct premise in order to reach the right conclusion about the cause of a failure. More
  • Agilent expands spectroscopy portfolio with A2 Technologies buy
    By Suzanne Deffree, Managing editor, news, January 18, 2011
    Agilent's acquisition of certain assets from Fourier transform infrared (FT-IR) company A2 Technologies will grow its spectroscopy business and follows on its acquisition of Varian. More
  • Die size does not determine IC cost
    Paul Rako, Technical Editor, January 6, 2011
    It is naive to think that a small analog die should have a low cost. More
  • Ensuring form, fit, and function for advanced interactive digital displays
    Bill Moodie, Zytronic Displays Limited, December 30, 2010
    The environment in which end-user equipment will be deployed has a critical influence on hardware selection, including the display front panel, which must provide a carefully optimized blend of optical, mechanical, and electrical properties. More
  • EDN Hot 100 products
    December 15, 2010
    EDN proudly presents its list of the Hot 100 products that in 2010 heated up the electronics world and grabbed the attention of our editors and our readers. More
  • The sharpest tool in the shed
    Mark Garfinkel, Consulting Engineer, December 15, 2010
    Three “heads” are better than one when troubleshooting a tough EMI problem. More
  • First-silicon encounters
    Frank Sauk, Presto Engineering Inc, December 9, 2010
    The four most common problems with first silicon are scan-chain failures, excess leakage current, signal integrity, and timing. More
  • Advantest bids on Verigy
    By Suzanne Deffree, Managing editor, news, December 6, 2010
    Although Verigy has reiterated its commitment to its merger deal with LTX-Credence, it will talk with Advantest about the test company's unsolicited $12.15 per share acquisition bid. More
  • Superman's X-ray vision would've come in handy
    Reginald W Neale, Engineer, December 2, 2010
    Real-world test deficiencies are masked by error-correction algorithms—most of the time. More
  • Agilent teams with Harvard's Wyss Institute on biologically inspired engineering
    By Suzanne Deffree, Managing editor, news, November 8, 2010


    The two organizations will work jointly to engineer life sciences technologies and instruments. One goal of the partnership is to provide deeper insights into the way physical forces and the mechanical properties of living tissues influence cell behavior and contribute to the onset and progression of diseases such as cancer. More
  • Bright lights, big pity
    Martin Moeller, Engineer, November 4, 2010
    How did it know? A videotape machine proves once again that Heisenberg was on to something. More
  • Essential principles for practical analog BIST
    Steve Sunter, Mentor Graphics, November 4, 2010
    Practical analog BIST has the potential to reduce IC-test costs and time to market. More
  • Frost & Sullivan to address high-speed serial interfaces
    Rick Nelson, Chief Editor, October 25, 2010
    To address the issues involved in successfully design embedded systems with serial interfaces, Frost & Sullivan will host a Webcast November 4. More
  • IEEE 1588-2008 perspectives and opportunities
    André Marais, Symmetricom Inc, October 21, 2010
    The revised Precision Time Protocol presents opportunities and some real-life challenges. More
  • Circuit synchronizes sensors and cameras
    Shih-Jie Chou, Rui-Cian Weng, and Tai-Shan Liao, National Applied Research Laboratories, Hsinchu, Taiwan; Edited by Martin Rowe and Fran Granville, October 21, 2010
    Trigger circuits provide measurements and images at the right time. More
  • Spread-spectrum clocking reduces EMI in embedded systems
    Miguel Rodriguez, PLX Technology and Lee Mohrmann, National Instruments, October 7, 2010
    PCI Express technology incorporates the use of spread-spectrum clocking to reduce EMI. More
  • Merry-go-round-missile mishap
    S Eren Balci, Aselsan, September 23, 2010
    Even the most mysterious failures have a reasonable cause. More
  • Sage simplifies development for AMD embedded platforms
    Rick Nelson, Chief Editor, September 21, 2010
    At the Embedded Systems Conference, AMD and Sage Electronic Engineering are showcasing a tool suite that gives software engineers a hardware interface to evaluate a system under development. More
  • NI COTS instrumentation to be integrated for big physics applications
    By Suzanne Deffree, Managing editor, news, September 20, 2010
    Vitrociset will integrate NI COTS (commercial off-the-shelf) hardware and software into its service packages to offer a product portfolio to organizations developing sophisticated physics projects. More
  • The devil’s in the details
    Brian Fernandes, Senior Design Engineer, September 9, 2010
    Sometimes it is more important to know the application than to design for it. More

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